Louisiana Distinguished Lecture Series |
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Dr. Kenneth W. Tobin
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| Abstract: The Measurement Science and Systems Engineering (MSSE) Division at the Oak Ridge National Laboratory was created in March of 2008. Although newly organized and named, MSSE has a rich history of scientific and engineering research and development that cuts across many research divisions at ORNL and addresses many science and engineering efforts of importance to the nation. The division performs measurement science related to electronics, sensors, signals, patterns, informatics, and communications to develop methods, devices, instruments, and systems that interact with the world to interpret data, provide understanding, and impart control. Our research supports programs in energy research, national security, biomedical engineering, basic science, and U.S. competitiveness. Through all of these program areas there are threads of commonality and productive collaboration with many organizations that leverage knowledge in one domain to make progress in others. In this presentation, Dr. Tobin will provide an introduction to the science and technology of ORNL and to some of our contributions in areas of applied research impacting energy, security, and human health. Specific examples will be detailed related to our progress in areas of gamma measurements for homeland security applications and for holographic microscopy for industrial inspection and biological imaging. He will conclude with a discussion of the variety of mechanisms available to research organizations around the world to collaborate with ORNL.
Biography: Dr. Kenneth W. Tobin is the Director of the Measurement Science and Systems Engineering Division at the Oak Ridge National Laboratory (ORNL). As director, he is responsible for the strategic direction of the division and for supporting the mission areas of the U.S. Department of Energy and ORNL in neutron science, energy research, high performance computing, complex biological systems, advanced materials, and national security. In his area of research, he was named an ORNL Corporate Research Fellow in 2003 for his contributions to the field of applied computer vision that addressed national interests in industrial and economic competitiveness, biomedical measurement science, and national security. He has authored and co-authored over 135 publications and he currently holds nine U.S. Patents with two additional patents pending in areas of computer vision, photonics, radiography, and microscopy. Dr. Tobin is a Fellow of the International Society for Optical Engineering where he is currently an Associate Editor for the Journal of Electronic Imaging. He is also a Senior Member of the Institute of Electrical and Electronics Engineers. He was the recipient of the R&D 100 Award by R&D Magazine in 2002 for his work in content-based image retrieval and he was the Tennessee Academy of Science Industrial Scientist of the Year in 2000 for his Leadership and Scientific Contributions to Semiconductor Metrology. He has a Ph.D. in Nuclear Engineering from the University of Virginia, Charlottesville, Virginia, and an MS in Nuclear Engineering and a BS in Physics from Virginia Tech., Blacksburg, Virginia. |
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